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Engineering ability of aerospace semiconductor device radiation experiment:

• TID(low dose rate 0.01~0.1rad(Si)/s high dose rate 1~10rad(Si)/s,50~300rad(Si)/s

• SEE(LET: 0.3~99MeV.cm2/mg)

• DDD (neutron, proton)

Establish the standards of radiation experiment in Chinese space industry:

• "Total dose radiation testing method of semiconductor devices for space application"

•"Test guidelines of single event effects induced by heavy ions of semiconductor devices for space application"

• "Displacement Damage test method of Optoelectronics for space applications"

China Aerospace Components Engineering Center (CACEC),CASC
E-mail: wzbck_cast@sina.com    Url: http://cacec.cast.cn
Add: 100094,No.104,Youyi Road,Haidian,Beijing,China    Tel: (86 10)6811 1017    Fax: (86 10)6811 1014