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Engineering ability of aerospace semiconductor device radiation experiment:
• TID(low dose rate 0.01~0.1rad(Si)/s high dose rate 1~10rad(Si)/s,50~300rad(Si)/s
• SEE(LET: 0.3~99MeV.cm2/mg)
• DDD (neutron, proton)
Establish the standards of radiation experiment in Chinese space industry:
• "Total dose radiation testing method of semiconductor devices for space application"
•"Test guidelines of single event effects induced by heavy ions of semiconductor devices for space application"
• "Displacement Damage test method of Optoelectronics for space applications"
|China Aerospace Components Engineering Center (CACEC),CASC|
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